Photoluminescence Spectrometer
[article date: 09.03.06]
The measurement of photoluminescence from semi-conductor materials has become an important characterisation method and is widely accepted to provide information on for example: carrier doping levels, alloy compositions, film structures, band gap and edge effects, etc
The measurement of photoluminescence from semi-conductor materials has become an important characterisation method and is widely accepted to provide information on for example: carrier doping levels, alloy compositions, film structures, band gap and edge effects, etc. in applications ranging from scientific research, process monitoring, or device characterisation.
The standard ZLX-PL system is configured for the measurement of samples at room temperature and can be extended to include samples in either a nitrogen or helium cryostat for low temperature processes.
System Configuration
| |
Room Temperature PL |
Low Temperature PL |
| Laser |
325 nm HeCd laser and Power supply |
| Monochromator |
Omni-lambda 300, Omni-lambda 500, Omni-lambda 750 |
| Sample Chamber |
SAC |
N2 or He Cryostat |
| Detector |
PMT-S1-CR131, DInGaAs1700 / 1600 |
| Data Acquisition |
DCS102, Lock-in Amplifiers |
| Software |
ZolixScan |
| Options |
Plasma Filter, Order Sorting Filter Wheel, Hg Spectral Calibration Lamp, Spectral Correction Lamp |